US Patent Issued to TEXAS INSTRUMENTS on July 29 for "Capacitance measuring system and method" (Chinese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,562, issued on July 29, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Capacitance measuring system and method" was invented by Jun Zhang (Shanghai) and Yaohua Pan (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system operable between a charging mode and a transferring mode for measuring capacitance of a capacitive sensor, includes a switching unit configured to, in a first phase of the charging mode, arrange the capacitive sensor to be charged by a first supply voltage from a first end of the capacitive sensor until a voltage difference between the first end and an opposite second end of the capacitive sensor reaches a first predeter...