US Patent Issued to Texas Instruments on Jan. 27 for "Fault detection front end architecture in resolver" (Texas Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,539, issued on Jan. 27, was assigned to Texas Instruments Inc. (Dallas).

"Fault detection front end architecture in resolver" was invented by Haydar Bilhan (Dallas) and Abhijit Das (Plano, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some examples, a method includes applying a bias voltage to a resolver system. The method also includes receiving a sensed signal, the sensed signal varying in value based on a position of a rotary element. The method also includes attenuating the sensed signal to form an attenuated signal. The method also includes performing fault detection on the attenuated signal to detect faults in the resolver system. Th...