ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,985, issued on Jan. 13, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Calibration scheme for a non-linear ADC" was invented by Himanshu Varshney (Bengaluru, India), Viswanathan Nagarajan (Bengaluru, India), Charls Babu (Bengaluru, India), Narasimhan Rajagopal (Bengaluru, India), Eeshan Miglani (Bengaluru, India) and Visvesvaraya A. Pentakota (Bengaluru, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "In described examples, an analog to digital converter (ADC), having an input operable to receive an analog signal and an output operable to output a digital representation of the analog signal, includes a voltage to delay (VD) block. The VD blo...