US Patent Issued to TEXAS INSTRUMENTS on Feb. 17 for "Systems and methods to perform automatic test pattern generation on multiple memory units in parallel" (Indian Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,645, issued on Feb. 17, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Systems and methods to perform automatic test pattern generation on multiple memory units in parallel" was invented by Nitesh Mishra (Chakeri, India) and Hrithik Sahni (New Delhi).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods may perform sequential automatic test pattern generation (ATPG) on parallel memory units. A first array of logic gates may output enable signals to cause multiple memory units to be enabled in parallel. Test pattern generation and test control logic may perform forward path testing, backward path testing, and any other appropriate test...