US Patent Issued to TEXAS INSTRUMENTS on Dec. 9 for "Test mode for glitch detection and bit miss in a digital isolator" (Indian Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,074, issued on Dec. 9, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Test mode for glitch detection and bit miss in a digital isolator" was invented by Krishnanunni B (Bangalore, India), Pratishthit Iyer (Bangalore, India), Kumar Anurag Shrivastava (Bangalore, India) and Rahul Prakash (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a transmitter, a voltage regulator, an isolator, and a test controller. The transmitter has an input, an output, and a first supply voltage terminal. The input couples to the apparatus' input terminal. The voltage regulator's input couples to a second supply voltage terminal. The ...