ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,495,614, issued on Dec. 9, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Stabilizing dielectric stress in a galvanic isolation device" was invented by Yoshihiro Takei (Ushiku, Japan), Mitsuhiro Sugimoto (Tsukuba, Japan), Byron Lovell Williams (Plano, Texas) and Jeffrey Alan West (Dallas).
According to the abstract* released by the U.S. Patent & Trademark Office: "A microelectronic device including an isolation device with a stabilized dielectric. The isolation device includes a lower isolation element, an upper isolation element, and an inorganic dielectric plateau between the lower isolation element and the upper isolation element. The dielectric sidewall of the inorganic dielect...