ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,393, issued on Aug. 5, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Testing interposer method and apparatus" was invented by Lee D. Whetsel (Parker, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure describes a novel method and apparatus for improving silicon interposers to include test circuitry for testing stacked die mounted on the interposer. The improvement allows for the stacked die to be selectively tested by an external tester or by the test circuitry included in the interposer."
The patent was filed on May 8, 2023, under Application No. 18/313,617.
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