ALEXANDRIA, Va., June 9 -- United States Patent no. 12,288,665, issued on April 29, was assigned to Tescan Brno s.r.o. (Brno, Czech Republic).
"Sample display method" was invented by Jiri Dluhos (Brno, Czech Republic).
According to the abstract* released by the U.S. Patent & Trademark Office: "A sample display method by means of a scanning electron microscope comprises at most one active objective lens located above a first scanning element and a second scanning element. A primary electron beam is deflected so as to be focused by an objective lens so that the beam propagates from the second scanning element towards a sample approximately parallel to the SEM optical axis, wherein the sample is also tilted relative to the SEM optical axis b...