ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,763, issued on Sept. 30, was assigned to TERUMO K.K. (Tokyo).
"Coating layer inspection device and method for inspecting coating layer" was invented by Yuno Kitagawa (Kanagawa, Japan) and Yasuo Kurosaki (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A coating layer inspection device and a method for inspecting a coating layer are disclosed that enable highly accurate evaluation of defectiveness in a coating layer of a subject. The coating layer inspection device includes a processing unit including a digitization unit that digitizes gray level information of each pixel, an average gray level calculation unit that calculates an aver...