ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,221, issued on June 24, was assigned to TERUMO K.K. (Tokyo).
"Component measurement device, component measurement device set, and information processing method" was invented by Ryokei Aikawa (Hiratsuka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A component measurement device includes: a chip insertion space into which a component measurement chip is insertable; a light emitting unit configured to emit irradiation light to the component measurement chip in a state in which the component measurement chip is located in the chip insertion space; a light receiving unit configured to receive light that has passed through or has been reflected b...