US Patent Issued to Terracon Consultants on March 18 for "Surface defect monitoring system" (Massachusetts, New York, Virginia Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,471, issued on March 18, was assigned to Terracon Consultants Inc. (Olathe, Kan.).

"Surface defect monitoring system" was invented by Scott Steffan (Hamburg, N.Y.), Constantine Papageorgiou (Needham, Mass.) and Amit Mehra (Arlington, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for taking high-resolution photographs from a vehicle-mounted camera, forming orthomosaics from video and/or multiple high-resolution photographs, and using artificial intelligence to detect and classify pavement flaws and defects in the imagery. Detection also includes the ability to capture quantifiable metrics for the defects and/or a region of interest. Th...