ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,118, issued on May 13, was assigned to TeraView Ltd. (Cambridge, Great Britain).
"Method and system for measuring coating thickness" was invented by Ian Stephen Gregory (Cambridge, Great Britain), Robert May (Cambridge, Great Britain) and Daniel James Farrell (Cambridge, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining the thickness of a plurality of coating layers. The method comprises the steps of performing a calibration analysis on calibration data to determine initial values and search limits of optical parameters of the plurality of coating layers, irradiating the plurality of layers with a pulse of THz rad...