ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,820, issued on Aug. 19, was assigned to TeraView Ltd. (Cambridge, Great Britain).

"Test system with adjustable delay line and radiation feedback control" was invented by Bryan Edward Cole (Cambridge, Great Britain), Darius Sullivan (Cambridge, Great Britain) and Simon Chandler (Cambridge, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to mo...