ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,141, issued on Nov. 4, was assigned to Teradyne Inc. (North Reading, Mass.).
"Identifying failures in device cores" was invented by Howard Lin (Boston) and Michael C. Panis (Somerville, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An example system is for testing a device under test (DUT) that includes a first core and a second core. The system includes channels in parallel for connecting to a number of pins on the DUT. The channels are for sending test data to the DUT and for receiving measurement data from the DUT based on the test data. The measurement data includes time-division-multiplexed (TDM) data comprised of successive data packets ...