US Patent Issued to Tera View on June 17 for "Test system" (British Inventor)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,297, issued on June 17, was assigned to Tera View Ltd. (Cambridge, Great Britain).

"Test system" was invented by Bryan Edward Cole (Cambridge, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected fro...