US Patent Issued to TELEDYNE SCIENTIFIC & IMAGING on Jan. 20 for "Method of recovering HgCdTe detector performance after high temperature bias-induced defect generation" (Pennsylvania Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,565, issued on Jan. 20, was assigned to TELEDYNE SCIENTIFIC & IMAGING LLC (Thousand Oaks, Calif.).

"Method of recovering HgCdTe detector performance after high temperature bias-induced defect generation" was invented by Milap Dalal (Lansdale, Pa.), Henry Yuan (North Wales, Pa.), Chad Shultz (Reading, Pa.) and Andrey Rumyantsev (Feasterville, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of baking a detector, the method comprising: placing a mid-wave infrared detector in an environmental chamber, wherein the environmental chamber is opaque. The mid-wave infrared detector comprises an anode, a guard terminal, and a cathode. The method fu...