US Patent Issued to Teledyne Adimec Advanced Image Systems on Nov. 11 for "X-ray detector with adaptive resolution" (Dutch Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,465,303, issued on Nov. 11, was assigned to Teledyne Adimec Advanced Image Systems B.V. (Eindhoven, Netherlands).

"X-ray detector with adaptive resolution" was invented by Reinder Gerrit Aartsen (Veldhoven, Netherlands) and Rene Weltje (Eindhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray detector comprises a detector panel (100) comprising a surface with a plurality of detector pixels, wherein the detector pixels are configured to convert received X-rays into electric signals representative of values indicative of the received X-rays. A data interface (308) transmits images having a fixed number of output pixels. A control uni...