ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,662, issued on Sept. 16, was assigned to Tektronix Inc. (Beaverton, Ore.).
"Machine learning model training using de-noised data and model prediction with noise correction" was invented by Wenzheng Sun (Beaverton, Ore.) and Pavel R. Zivny (Portland, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement system has one or more inputs connectable to a device under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: gather a set of training waveforms by acquiring one or more waveforms from one or more DUTs or from simulated waveforms, remove noise from the set of training wav...