US Patent Issued to Tektronix on Oct. 7 for "Fast stressed-eye calibration for receiving testing" (Indian, American Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,189, issued on Oct. 7, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Fast stressed-eye calibration for receiving testing" was invented by Subhankar Ghose (Bangalore, India), Ankit Dash (Bangalore, India) and David M. Bouse (Camas, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a...