US Patent Issued to Tektronix on Oct. 14 for "Tuning a device under test using parallel pipeline machine learning assistance" (Oregon Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,852, issued on Oct. 14, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Tuning a device under test using parallel pipeline machine learning assistance" was invented by John J. Pickerd (Hillsboro, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connecte...