US Patent Issued to Tektronix on June 17 for "Thermal management system for a test-and-measurement probe" (Oregon Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,277, issued on June 17, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Thermal management system for a test-and-measurement probe" was invented by Matthew J. Hull (Beaverton, Ore.), Julie A. Campbell (Beaverton, Ore.) and David Thomas Engquist (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a test-and-measurement probe within an interior cavity of the shroud, while permitting a second portion of the test-and-measurement probe head to extend out of ...