ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,755, issued on July 1, was assigned to Tektronix Inc. (Beaverton, Ore.).
"Reverse recovery measurements and plots" was invented by Vivek Shivaram (Bangalore, India), Niranjan R Hegde (Siddapur, India), Parjanya Adiga (Bengaluru, India), Krishna N H Sri (Bengaluru, India), Tsuyoshi Miyazaki (Kawaguchi, Japan), Yogesh M. Pai (Bengaluru, India) and Venkatraj Melinamane (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to: receive waveform data from the DUT, locate one or more reverse recovery regio...