ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,039, issued on Jan. 28, was assigned to Tektronix Inc. (Beaverton, Ohio).
"Multi-mode measurement probe" was invented by Joshua J. O'Brien (Aloha, Ore.) and Josiah A. Bartlett (Forest Grove, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that ca...