US Patent Issued to Tektronix on Dec. 23 for "Automated recognition of a device under test" (American, Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,466, issued on Dec. 23, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Automated recognition of a device under test" was invented by Sam J. Strickling (Portland, Ore.), Andrew McCann (Beaverton, Ore.), Daniel S. Froelich (Portland, Ore.), Michelle L. Baldwin (Mount Juliet, Tenn.), Jonathan San (Palo Alto, Calif.) and Lin-Yung Chen (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for automated recognition of a device under test and retrieving data associated with the device under test based on the recognition. The systems and methods include receiving a recognition key based on an identifying characteristic o...