US Patent Issued to Tektronix on Dec. 16 for "Flexible wide bandgap double pulse testing methodology" (Indian, Japanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,410, issued on Dec. 16, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Flexible wide bandgap double pulse testing methodology" was invented by Vivek Shivaram (Bangalore, India), Niranjan R Hegde (Siddapur, India), Parjanya Adiga (Bengaluru, India), Krishna N H Sri (Bengaluru, India), Tsuyoshi Miyazaki (Kawaguchi, Japan), Yogesh M. Pai (Bengaluru, India) and Venkatraj Melinamane (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the ...