US Patent Issued to Tektronix on Aug. 12 for "Semi-automated oscilloscope noise compensation based on power spectral density characterization" (Oregon Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,949, issued on Aug. 12, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Semi-automated oscilloscope noise compensation based on power spectral density characterization" was invented by Mark L. Guenther (Portland, Ore.) and Pavel R. Zivny (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of dynamically determining an oscilloscope noise characteristic includes retrieving a power spectral density (PSD) model of noise from a storage based upon a current configuration of the oscilloscope, generating a representation of any filtering being applied to a waveform generated by a device under test, using the PSD and the representation...