US Patent Issued to TECNOSENS on Sept. 30 for "Non-contact dimensional measurement device with micrometric resolution" (Italian Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,329, issued on Sept. 30, was assigned to TECNOSENS S.P.A. (Brescia, Italy).

"Non-contact dimensional measurement device with micrometric resolution" was invented by Alessandro Cominelli (Brescia, Italy), Matteo Perletti (Brescia, Italy) and Danilo Lentini (Brescia, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A non-contact dimensional measurement device with micrometric resolution for measuring a distance from an object provided with at least one reflective surface extends along an axis (X-X) and has a light source that produces an emitted light beam towards the object so that the at least one reflective surface produces a reflected light b...