US Patent Issued to TECHNOPROBE on Oct. 28 for "Contact element for a probe head for testing high-frequency electronic devices and relating probe head" (Italian Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,299, issued on Oct. 28, was assigned to TECHNOPROBE S.P.A. (Cernusco Lombardone, Italy).

"Contact element for a probe head for testing high-frequency electronic devices and relating probe head" was invented by Roberto Crippa (Cernusco Lombardone, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A contact element for a probe head for an electronic device test apparatus is disclosed, having a body extending along a longitudinal axis between a first and a second opposite contact end, each made of electrically conductive material. The body includes a first section which extends over a distance less than 1000 micro metre along the longitudinal axis s...