ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,655, issued on May 27, was assigned to TECHNOPROBE S.P.A. (Cernusco Lombardone, Italy).
"Testing head having improved frequency properties" was invented by Flavio Maggioni (Cernusco Lombardone, Italy).
According to the abstract* released by the U.S. Patent & Trademark Office: "A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer includes a plurality of contact elements, each including a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house the contact elements. The guide includes a conductive portion that includes and electrically connects the holes...