US Patent Issued to TECHNOPROBE on Dec. 2 for "Large probe head for testing electronic devices and related manufacturing method" (Italian Inventor)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,253, issued on Dec. 2, was assigned to TECHNOPROBE S.P.A. (Cernusco Lombardone, Italy).

"Large probe head for testing electronic devices and related manufacturing method" was invented by Flavio Maggioni (Cernusco Lombardone, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for manufacturing a probe head for the functionality testing of devices under test (DUT) is disclosed. The method includes providing a containment element, arranging a lower guide at a lower face of the containment element which faces toward the devices under test during the test, and arranging an upper guide at an upper face of the containment element. The containment...