US Patent Issued to Technische Universiteit Delft on Jan. 27 for "Controlling uniformity of an array of quantum dots" (Dutch Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,460, issued on Jan. 27, was assigned to Technische Universiteit Delft (Delft, Netherlands).

"Controlling uniformity of an array of quantum dots" was invented by Menno Veldhorst (Zoetermeer, Netherlands) and Nico Willem Hendrickx (Delft, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of controlling random charge effects originating from local defects (202-1, 202-2, 202-3) above a quantum dot in a quantum dot array is described, wherein the method comprises: selecting one or more electrodes (Vg, Vb) configured to control one or more quantum structures formed in one or more semiconductor layers arranged on a substrate; and, applyin...