ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,951, issued on Nov. 11, was assigned to TECAT TECHNOLOGIES (SUZHOU) Ltd. (Suzhou, China).
"Probe device" was invented by Choon Leong Lou (Singapore).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a probe device. The probe device includes a first probe structure and a second probe structure. The first probe structure includes: a first body, a first substrate and a plurality of first probes. The first substrate is disposed on the first body. The first probes electrically connects to the first substrate and protrudes from a surface of the first substrate. The second probe structure includes: a second body, a second substr...