US Patent Issued to TECAT TECHNOLOGIES (SUZHOU) on Dec. 23 for "Probe card structure including probe sets with different lengths" (Singaporean Inventor)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,443, issued on Dec. 23, was assigned to TECAT TECHNOLOGIES (SUZHOU) Ltd. (Suzhou, China).

"Probe card structure including probe sets with different lengths" was invented by Choon Leong Lou (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card structure including probe sets with different lengths is provided. The probe card structure includes an upper guide plate set, a lower guide plate set, a first probe set, a second probe set, and a stiffener. The upper guide plate set includes a first upper guide plate. The lower guide plate set includes a first lower guide plate and a second lower guide plate. The first probe set at least inclu...