US Patent Issued to TDK on Oct. 28 for "Magnetic field detection apparatus and current detection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,302, issued on Oct. 28, was assigned to TDK Corp. (Tokyo).

"Magnetic field detection apparatus and current detection apparatus" was invented by Norikazu Ota (Tokyo), Kenzo Makino (Tokyo) and Hiraku Hirabayashi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic field detection apparatus includes a magnetoresistive effect element and a helical coil. The magnetoresistive effect element includes a magnetoresistive effect film extending in a first axis direction. The helical coil includes a parallel connection including first and second parts extending in a second axis direction inclined with respect to the first axis direction. The first a...