US Patent Issued to TDK on July 8 for "Piezoelectric thin film, piezoelectric thin film element and piezoelectric transducer" (Japanese Inventor)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,356,861, issued on July 8, was assigned to TDK Corp. (Tokyo).

"Piezoelectric thin film, piezoelectric thin film element and piezoelectric transducer" was invented by Junpei Morishita (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a piezoelectric thin film containing a tetragonal crystal 1 of a perovskite type oxide and a tetragonal crystal 2 of the oxide. A (001) plane of the tetragonal crystal 1 and a (001) plane of the tetragonal crystal 2 are oriented in a normal direction of a surface of the piezoelectric thin film. An interval of the (001) plane of the crystal 1 is c1. An interval of a (100) plane of the crystal 1 is al. An interv...