US Patent Issued to TDK on Dec. 16 for "Piezoelectric thin film, piezoelectric thin film element, and piezoelectric transducer" (Japanese Inventor)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,501,832, issued on Dec. 16, was assigned to TDK Corp. (Tokyo).

"Piezoelectric thin film, piezoelectric thin film element, and piezoelectric transducer" was invented by Junpei Morishita (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A piezoelectric thin film includes a first piezoelectric layer and a second piezoelectric layer directly stacked on the first piezoelectric layer. The first piezoelectric layer contains a tetragonal crystal 1 of a perovskite-type oxide. The second piezoelectric layer contains a tetragonal crystal 2 of a perovskite-type oxide. A (001) plane of the tetragonal crystal 1 is oriented in a normal direction do of a surface of...