ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,401, issued on Aug. 5, was assigned to TDK Corp. (Tokyo).
"Magnetic field detection apparatus and current detection apparatus" was invented by Takafumi Kobayashi (Tokyo), Norikazu Ota (Tokyo) and Kenzo Makino (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic field detection apparatus includes a magnetoresistive effect element and a coil. The coil includes first and second tier parts opposed to each other in a first axis direction, with the magnetoresistive effect element interposed therebetween. The coil is configured to be supplied with a current and thereby configured to generate an induction magnetic field to be applied to the magne...