US Patent Issued to TDK on Aug. 5 for "Magnetic field detection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,432, issued on Aug. 5, was assigned to TDK Corp. (Tokyo).

"Magnetic field detection apparatus" was invented by Keisuke Takasugi (Tokyo) and Kenzo Makino (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic field detection apparatus includes a substrate, first and second projections, first and second MR films, and first and second wiring lines. The first and second projections are provided on a flat surface of the substrate and each include first and second inclined surfaces. The first and second MR films are provided on the first and second inclined surfaces, respectively. The first wiring line couples the first MR film on the first incli...