US Patent Issued to TDK on April 15 for "Electromagnetic environment analysis system, electromagnetic environment analysis method, and non-transitory computer-readable medium" (Japanese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,277,723, issued on April 15, was assigned to TDK Corp. (Tokyo).

"Electromagnetic environment analysis system, electromagnetic environment analysis method, and non-transitory computer-readable medium" was invented by Shunya Sato (Tokyo) and Tatsuya Hayashi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an electromagnetic environment analysis system 1, a display range determination unit determines a display range in which information relevant to a measurement value is displayed in the image, based on a detection result of a second marker. A position calculation unit calculates a relative position between a first marker and the second marker, base...