US Patent Issued to TCL China Star Optoelectronics Technology on Feb. 10 for "Detection device configured to detect abnormality of light-emitting panel and detection method thereof" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,811, issued on Feb. 10, was assigned to TCL China Star Optoelectronics Technology Co. Ltd. (Shenzhen, China).

"Detection device configured to detect abnormality of light-emitting panel and detection method thereof" was invented by Wuhui Wang (Guangdong, China), Xing Ouyang (Guangdong, China) and Litao Yang (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection device, a detection method, and a display device for detecting abnormality of a light-emitting panel are provided. The detection device includes a first substrate, a detection metal layer disposed on the first substrate, and a detection unit. The detection metal layer inc...