US Patent Issued to TASMIT on Aug. 12 for "Pattern matching method" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,341, issued on Aug. 12, was assigned to TASMIT INC. (Yokohama, Japan).

"Pattern matching method" was invented by Yuji Miura (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The method includes: determine a first integrated value by integrating measured values of widths of reference patterns (210A) belonging to a first group; determine a second integrated value by integrating measured values of widths of reference patterns (210B) belonging to a second group; performing second matching between patterns on an image of a second region and corresponding CAD patterns; determining a third integrated value by integrating measured values of wi...