ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,655, issued on July 1, was assigned to TAIYUAN UNIVERSITY OF TECHNOLOGY (Taiyuan, China) and State Grid Shanxi Electric Power Research Institute (Taiyuan, China).

"Subsurface defect detecting device for cylindrical components and method thereof" was invented by Yanjie Zhang (Taiyuan, China), Zhiqi Xu (Taiyuan, China), Tao Wang (Taiyuan, China), Lu Bai (Taiyuan, China), Wei Wang (Taiyuan, China), Hong Liu (Taiyuan, China), Lixin Wu (Taiyuan, China), Maosen Yin (Taiyuan, China), Zhihui Xu (Taiyuan, China) and Yaxing Liu (Taiyuan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A subsurface defect detecting device for cylindrical components and met...