US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Sept. 30 for "Method for detecting contact force of probe card" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,501, issued on Sept. 30, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Method for detecting contact force of probe card" was invented by Ming-Cheng Hsu (Hsin-Chu, Taiwan), Te-Kun Lin (Tainan, Taiwan), Yu-Hsien Tsai (Tainan, Taiwan) and Wen-Tsai Su (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a contact force of a probe card is provided. The method includes contacting a pressure film sensor with a plurality of needles over a lower surface of the probe card. The method includes detecting the contact force of the probe card via the pressure film sensor. The method also incl...