US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Sept. 2 for "Target measurement device and method for measuring a target" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,359, issued on Sept. 2, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Target measurement device and method for measuring a target" was invented by Pradip Girdhar Chaudhari (Hsinchu, Taiwan), Che-Hui Lee (Taipei, Taiwan), Chih-Cheng Wei (Hsinchu, Taiwan), Wen-Cheng Yang (Hsinchu, Taiwan) and Chyi-Tsong Ni (Hsin-Chu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A target measurement device is provided. The target measurement device includes a fixing ring, a main body, and a transceiver. The fixing ring has a first surface. The main body is over the first surface of the fixing ring. The transceiver is coupl...