US Patent Issued to Taiwan Semiconductor Manufacturing on Oct. 7 for "Scan synchronous-write-through testing architectures for a memory device" (Taiwanese, Canadian, American Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,858, issued on Oct. 7, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Scan synchronous-write-through testing architectures for a memory device" was invented by Ming-Hung Chang (Tainan, Taiwan), Atul Katoch (Kanata, Canada), Chia-En Huang (Hsinchu County, Taiwan), Ching-Wei Wu (Nantou County, Taiwan), Donald G. Mikan Jr. (Austin, Texas), Hao-I Yang (Taipei, Taiwan), Kao-Cheng Lin (Taipei, Taiwan), Ming-Chien Tsai (Kaohsiung, Taiwan), Saman M. I. Adham (Kanata, Canada), Tsung-Yung Chang (Hsinchu, Taiwan) and Uppu Sharath Chandra (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "An exemplary testing environme...