US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Oct. 7 for "Calibration system for wavelength-division multiplexing, wavelength-division multiplexing system, and calibrating method for wavelength-division multiplexing" (Taiwanese, American Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,335, issued on Oct. 7, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Calibration system for wavelength-division multiplexing, wavelength-division multiplexing system, and calibrating method for wavelength-division multiplexing" was invented by Tai-Chun Huang (New Taipei, Taiwan), Lan-Chou Cho (Hsinchu, Taiwan), Chewn-Pu Jou (Hsinchu, Taiwan) and Stefan Rusu (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a calibration system for wavelength-division multiplexing (WDM), a WDM system, and a calibrating method for WDM. The calibration system includes heating devices, ...