US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Oct. 21 for "Method and system for determining equivalence of design rule manual data and design rule checking data" (Taiwanese, American Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,450,412, issued on Oct. 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Method and system for determining equivalence of design rule manual data and design rule checking data" was invented by Chin-Chou Liu (Hsinchu County, Taiwan), Yi-Kuang Lee (Hsinchu, Taiwan) and Lie-Szu Juang (Saratoga, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method and a system for determining the equivalence of the DRM data set and the DRC data set. The system retrieves a DRM data set and a DRC data set, and transforms the DRM data set and the DRC data set into a first data structure node and a...