ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,676, issued on Oct. 14, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING Co. LTD. (Hsinchu, Taiwan).

"Self-aligned via for interconnect structure" was invented by Chieh-Han Wu (Kaohsiung, Taiwan), Cheng-Hsiung Tsai (Miaoli County, Taiwan), Chih Wei Lu (Hsinchu, Taiwan) and Chung-Ju Lee (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Interconnect structures and methods of forming the same are provided. An interconnect structure according to the present disclosure includes a conductive line feature over a substrate, a conductive etch stop layer over the conductive line feature, a contact via over the conductive etch stop layer, and a...