US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Nov. 4 for "Inspection apparatus for inspecting electrical equipment" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,154, issued on Nov. 4, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Inspection apparatus for inspecting electrical equipment" was invented by Chun Hung Yang (Tainan, Taiwan) and Ning Kang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus for performing electrical equipment inspection includes a rod, a probe attached to an end of the rod, an infrared imaging sensor disposed on the probe, at least one visible light source disposed on the probe, and a visible light imaging sensor disposed on the probe. Infrared imaging data acquired by the infrared imaging sensor are transmitte...