US Patent Issued to Taiwan Semiconductor Manufacturing on Nov. 25 for "Dynamic error monitor and repair" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,482,531, issued on Nov. 25, was assigned to Taiwan Semiconductor Manufacturing Co. LTD (Taiwan).

"Dynamic error monitor and repair" was invented by Hiroki Noguchi (Hsinchu, Taiwan), Ku-Feng Lin (New Taipei, Taiwan) and Yih Wang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device includes: a memory cell array comprising a plurality of memory cells, the plurality of memory cells comprising a plurality of data memory cells including a first data memory cell and a plurality of backup memory cells including a first backup memory cell; a storage storing an error table configured to record errors in the plurality of data memory cell...